Deep Learning, Quality Analytics/Smart Manufacturing
Jo, Y., Kahng, H*., Kim, S.B.* (2024+). Deep semi-supervised regression via pseudo-label filtering and calibration, Applied Soft Computing, In Press.
Impact Factor:8.7
#semi-supervised learning
International Paper
Deep Learning, Natural Language Processing
Jeong, J., Baek, I., Bang, B., Lee, J., Song, U., Kim, S.B. * (2024+). FALL: prior failure detection in large scale system based on language model, IEEE Transactions on Dependable and Secure Computing, In Press.
Impact Factor:7.3
#fault detection#large language models
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Baek, I., Hwang, S., Kim, S.B.* (2024+). CowSSL:contrastive open-world semi-supervised learning for wafer bin map, Journal of Intelligent Manufacturing, In Press
#semi-supervised learning#wafer bin maps#open set
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Choi, J., Kim, S.B.* (2024+). Multi-stage process diagnosis networks in semiconductor manufacturing, IEEE Access, In Press.
DOI: 10.1109/ACCESS.2024.3375367
Impact Factor:3.9
#semiconductor manufacturing#multi-sage process
International Paper
Deep Learning, Healthcare/Biomedicine
Ahn, S.H., Jo, Y.W., Park J.H., Kim, S.M., Kim, J.I., Kim, S.B., Lee, M.G., Lee, S.M.*, Kim., Y.H.* (2024+). Multimodal human action recognition for rehabilitation exercise of upper body for individuals with cerebral palsy, IEEE Transactions on Systems, Man, and Cybernetics: Systems, In Press
#human activity recognition#multimodal
International Paper
Deep Learning, Healthcare/Biomedicine
Lim, S., Lee, Y.J., Kim, S.B.* (2024). SWISS: signal-wise self-supervised learning to learn a multi-signal interaction for human activity recognition, Knowledge-Based Systems, Vol. 287, 111464 (March 5)
Deep Learning, Quality Analytics/Smart Manufacturing
Cho, Y.S., Kim, S.B.* (2024+). Supervised contrastive learning for multisensor signals classification in automobile engine manufacturing, IEEE Transactions on Industrial Informatics, In Press.
Deep Learning, Quality Analytics/Smart Manufacturing
Baek, I., Kim, S.B. (2024), Contrastive deep clustering for detecting new defect patterns in wafer bin maps, The International Journal of Advanced Manufacturing, Vol. 130, pp.3561-3571 (January 5)
DOI: 10.1007/s00170-023-12939-0
Impact Factor:3.4
#wafer bin map#wafer#defects#open set
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Sim, S., Bae, J., Kim, S.B.*(2024). Robust semi-supervised regression for vehicle interior noise prediction, IEEE Access, Vol.12, pp.60-72.
Kim, J., Lee, Y.J., Heo, J., Park, J., Kim, J., Lim, S.R., Jeong, J., Kim, S.B.* (2023), Sample-efficient multi-agent reinforcement learning with masked reconstruction, PLOS ONE, 18(9): e0291545. https://doi.org/10.1371/journal.pone.0291545 (September 14)
DOI: https://doi.org/10.1371/journal.pone.0291545
Impact Factor:3.7
#multi-agent#self-supervised learning
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Baek, M., Kim, S.B.*(2023). Failure detection and primary cause identification of multivariate time series data in semiconductor equipment, IEEE Access, Vol.11, pp.54636-54372 (May).
Lee, J., Kim, Y*., Kim, S.B.* (2023). Noise-robust graph-based semi-supervised learning with dynamic shaving label propagation, Applied Soft Computing, Vol.142, 110371 (July)
DOI: https://doi.org/10.1016/j.asoc.2023.110371
Impact Factor:8.263
#semi-supervised learning#graph
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Kwak, M., Lee, Y., Kim, S.B.* (2023). SWaCo: Safe wafer bin map classification with self-supervised contrastive learning, IEEE Transactions on Semiconductor Manufacturing, Vol. 36, Issue 3, pp. 416-424 (May).
DOI: 10.1109/TSM.2023.3280891
Impact Factor:2.7
#semiconductor#wafer bin map#self-supervised learning#contrastive learning
International Paper
Deep Learning, Game
Kim, C., Bae, J., Baek, I., Jeong, J., Lee, Y.J., Park, K., Shim, S.H., Kim, S.B.*(2023). DESEM: Depthwise separable convolution-based multimodal deep learning for In-game action anticipation, IEEE Access, Vol.11, pp. 46504 - 46512, April 27.
DOI: 10.1109/ACCESS.2023.3271282
Impact Factor:3.476
#convolutional neural network
International Paper
Deep Learning, Reinforcement Learning, Game
Lee, Y.J., Kim, J., Kwak, M., Park, Y.J.*, Kim, S.B.* (2023). STACoRe: Spatio-temporal and action-based contrastive representations for reinforcement learning in Atari, Neural Networks, Vol.160, Page 1-11 (March)
DOI: https://doi.org/10.1016/j.neunet.2022.12.018
Impact Factor:9.657
#contrastive learning#game
International Paper
Machine Learning
Jen, H-C, Huff, B., LeBoulluec, A.K., Nasirian, B., Kim, S.B., Rosenberger, J.M., Chen, V.C.P. (2022). A discrete-event simulation tool for airport deicing activities: Dallas-Fort Worth International Airport, Simulation-Transactions of the Society for Modeling and Simulation International, Vol.98, Issue 12, pp.1097~1114 (December).
DOI: 10.1177/00375497221101064
Impact Factor:1.377
#simulation
International Paper
Machine Learning, Deep Learning
Park, J., Y.J. Lee, Y. Jo, J. Kim, J.H, Han, J.H., Kim, K.J., Kim, Y.T., Kim, S.B.*(2022).Spatio−temporal network for sea fog forecasting, Sustainability, Vol.14, Issue 23, 16163.
DOI: 10.3390/su142316163
Impact Factor:3.889
#image#multimodal#augmentation#prediction
International Paper
Deep Learning
Oh, H., Kim, S.B.*(2022). Multivariate time series open-set recognition using multi-feature extraction and reconstruction, IEEE Access, Vol.10, pp.120063-120073.
DOI: 10.1109/ACCESS.2022.3222310
Impact Factor:3.476
#human activity recognition#sensor#multichannel#open set
International Paper
Deep Learning
Lee, M., Kim, S.B.*(2022). Sensor-based open-set human activity recognition using representation learning with mixup triplets, IEEE Access, Vol.10, pp.119333-119344.
Lee, M., Kim, S.B.*(2022). HAPGNN: Hop-wise attentive PageRank-based graph neural network, Information Sciences, Volume 613, Pages 435-452. (October)
DOI: https://doi.org/10.1016/j.ins.2022.09.041
Impact Factor:8.233
#Graph Neural Network
International Paper
Deep Learning
Bae, J., Lee, M., Kim, S.B.* (2022). Safe semi-supervised learning using a Bayesian neural network, Information Sciences, Vol. 612, Pages 453-464. (October)
DOI: 10.1016/j.ins.2022.08.094
Impact Factor:8.233
#Bayesian#semi-supervised learning
International Paper
Deep Learning
Lee, H.K., Lee, J., Kim, S.B.* (2022). Boundary-focused generative adversarial networks for imbalanced and multimodal time series, IEEE Transactions on Knowledge and Data Engineering, Vol.34, No.9, pp. 4102-4118. (September)
Deep Learning, Quality Analytics/Smart Manufacturing
Cho, Y.S., Kim, S.B.* (2022). Quality-discriminative localization of multisensor signals for root cause analysis, IEEE Transactions on Systems, Man, and Cybernetics: Systems, Vol. 52, No. 7, pp.4374-4387. (July)
Deep Learning, Quality Analytics/Smart Manufacturing
Lee, J., Kim, S.B.* (2022), Uncertainty-aware hierarchical segment-channel attention mechanism for reliable and interpretable multichannel signal classification, Neural Networks, Vol.150, pp. 68-86. (June)
DOI: https://doi.org/10.1016/j.neunet.2022.02.019
Impact Factor:9.657
#signal#uncertainty#multichannel#neural networks
International Paper
Deep Learning, Game
Baek, I., Kim, S.B.* (2022). 3-dimensional convolutional neural networks for predicting StarCraft Ⅱ results and extracting key game situations, PLOS ONE, PLoS ONE 17(3): e0264550. (March)
DOI: https://doi.org/10.1371/journal.pone.0264550
Impact Factor:3.24
#game#image#convolutional neural network
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Shin, W., Kahng, H., Kim, S.B.* (2022). Mixup-based classification of mixed-type defect patterns in wafer bin maps, Computers & Industrial Engineering, 167(1):107996. (February)
DOI: 10.1016/j.cie.2022.107996
Impact Factor:5.431
#wafer#wafer bin map#image#semiconductor
International Paper
Machine Learning, Healthcare/Biomedicine
Lee, E. S.*, Kim, J. Y.*, Yoon, Kim, S.B., Kahng, H., Park, J., Kim, J., Lee, M., Hwang, H., Park, S.G. (2022). A machine learning-based study of the effects of air pollution and weather in respiratory disease patients visiting emergency departments, Emergency Medicine International, Vol.2022, Article ID 4462018, 20 pages
DOI: https://doi.org/10.1155/2022/4462018
Impact Factor:1.112
#Emergency medical service
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Do, H., Lee, C., Kim, S.B. (2022). Hierarchical spatial-test attention network for explainable multiple wafer bin map classification, IEEE Transactions on Semiconductor Manufacturing, , Vol.35, No. 1, pp.78-86. (February)
DOI: 10.1109/TSM.2021.3121006
Impact Factor:2.874
#XAI#classification#wafer bin map#wafer#image
International Paper
Machine Learning, Deep Learning, Quality Analytics/Smart Manufacturing
Moon, S., Cho, H., Koh, E., Cho, Y.S., Oh, H.L., Kim, Y.*, Kim, S.B.* (2022). Remanufacturing decision-making for gas insulated switchgear with remaining useful life prediction, Sustainability, 14(19), 12357.
DOI: https://doi.org/10.3390/su141912357
Impact Factor:3.889
#remaining useful life#prediction
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Lee, M., Bae, J., Kim, S.B.* (2021). Uncertainty-aware soft sensor using Bayesian recurrent neural networks, Advanced Engineering Informatics, Vol.50, 101434. (October)
Jo, Y., Lee, S., Lee, Y., Kahng, H., Park, S., Bae, S, Kim, M.K., Han, S.W., Kim, S.B. * (2021). Semantic segmentation of cabbage in the South Korea highlands with images by unmanned aerial vehicles, Applied Sciences, 11(10), 4493
DOI: https://doi.org/10.3390/app11104493
Impact Factor:2.474
#image segmentation#image
International Paper
Deep Learning, Healthcare/Biomedicine, Reinforcement Learning
Lee, Y.J., Kahng, H., Kim, S.B. (2021). Generative adversarial networks for De Novo molecular design, Molecular Informatics, 40, 2100045.
Deep Learning, Quality Analytics/Smart Manufacturing
Lee, J., Do. H.*, Kwak M., Kahng, H., Kim, S.B. (2021). Hierarchical segment-channel attention network for explainable multichannel signal classification, Information Sciences, Vol. 567, pp.312-331. (August)
DOI: https://doi.org/10.1016/j.ins.2021.03.024
Impact Factor:8.233
#sensor#monitoring#fault#time series
International Paper
Machine Learning, Healthcare/Biomedicine
Park, S.G., Kim, J-Y*, Yoon, Y-H, Lee, E. S., Kim, H-J, Kim, S.B., Kahng, H. (2021). Analysis of the adequacy of pre-hospital emergency medical services use of patients who visited emergency departments in Korea from 2016 to 2018: data from the national emergency department information system, Emergency Medicine International, Vol. 2021. Article ID 6647149.
DOI: https://doi.org/10.1155/2021/6647149
Impact Factor:1.112
#Biomedicine#Emergency medical service#chemistry
International Paper
Machine Learning, Deep Learning, Quality Analytics/Smart Manufacturing
Kwak, M., Kim, S.B.*(2021). Unsupervised abnormal sensor signal detection with channelwise reconstruction errors, IEEE Access, Vol. 9, pp.39995-40007. (March)
DOI: 10.1109/ACCESS.2021.3064563
Impact Factor:3.745
#signal#reconstruction errors#sensors
International Paper
Machine Learning
Kim, Y., Lee, M., Kim, S.B.* (2021). Swarm ascending: swarm intelligence-based exemplar group detection for robust clustering, Applied Soft Computing, Vol. 102, 107062. (April)
DOI: https://doi.org/10.1016/j.asoc.2020.107062
Impact Factor:5.472
#clustering#machine learning
International Paper
Machine Learning, Deep Learning, Quality Analytics/Smart Manufacturing
Mok, C., Baek, I., Cho, Y.S., Kim, Y. *, Kim, S.B.* (2021), Pallet recognition with multi-task learning for automated guided vehicles, Applied Sciences, 11(24), 11808. (December)
DOI: https://doi.org/10.3390/app112411808
Impact Factor:2.679
#image#multitask#vision
International Paper
Machine Learning, Deep Learning, Quality Analytics/Smart Manufacturing
Kahng, H., Kim, S.B.* (2021). Self-supervised representation learning for wafer bin map defect pattern classification, IEEE Transactions on Semiconductor Manufacturing, Vol. 34, No. 1, pp.74-86. (February)
DOI: 10.1109/TSM.2020.3038165
Impact Factor:1.977
#wafer#wafer bin map#self-supervised learning#image
International Paper
Healthcare/Biomedicine, Reinforcement Learning
Ariyajunya, B., Ying, C*., Chen, V., Rosenberger, J., Kim, S.B. (2021). Addressing state space multicollinearity in solving an ozone pollution dynamic control problem, European Journal of Operational Research, Vol.289, Issue 2, pp.683-695 (March)
Impact Factor:4.213
#pollution#optimization
International Paper
Machine Learning
Do, H., Cheon, M.-S., Kim, S.B.* (2020). Graph structured sparse subset selection, Information Sciences, Vol.518, pp.71-94. (May)
DOI: https://doi.org/10.1016/j.ins.2019.12.086
Impact Factor:5.910
#feature selection#optimization
International Paper
Deep Learning, Reinforcement Learning, Game
Park, Y.J., Lee, Y.J., Kim, S.B.*(2020). Cooperative multi-agent reinforcement learning with approximate model learning , IEEE Access, Vol. 8, pp.125389-125400.
DOI: 10.1109/ACCESS.2020.3007219
Impact Factor:3.745
#agent
International Paper
Machine Learning
Yu, J., Zhong, H., Kim, S.B.* (2020). An ensemble feature ranking algorithm for clustering analysis, Journal of Classification, Vol.32, No.2, pp.462-489.
DOI: https://doi.org/10.1007/s00357-019-09330-8
Impact Factor:1.156
#clustering
International Paper
Deep Learning, Healthcare/Biomedicine
Kim, Y., Lee, J., Ahn, G., Santos, I.C., Schug, K., Kim, S.B.* (2020). Convolutional neural network for preprocessing-free bacterial spectra identification, Journal of Chemometrics, 34, e3304.
Lee, S., Kim, S.B.* (2020). Parallel simulated annealing with a greedy algorithm for Bayesian network structure learning, IEEE Transactions on Knowledge and Data Engineering, Vol.32, No.6, pp.1157-1166. (June)
Park, S.H., Kim, S.B.* (2020). Robust expected model change for active learning in regression, Applied Intelligence, Vol. 50, pp.296-313.
DOI: https://doi.org/10.1007/s10489-019-01519-z
Impact Factor:3.325
#active learning
International Paper
Deep Learning, Quality Analytics/Smart Manufacturing
Lee, S., Kim, H.J., Kim, S.B.* (2020). Dynamic dispatching system using a deep denoising autoencoder for semiconductor manufacturing, Applied Soft Computing, Vol. 86, 105904 (January).
Lee, S., Kim, Y., Kahng, H., Lee, S.-K., Chung, S., Cheong, T., Shin, K., Park, J., Kim, S.B.* (2020). Intelligent traffic control for autonomous vehicle systems based on machine learning, Expert Systems with Applications, Vol. 144, 113074. (April)
DOI: https://doi.org/10.1016/j.eswa.2019.113074
Impact Factor:5.452
#logistics#dispatching
International Paper
Machine Learning
Yu, J., Kim, S.B., Bai, J., Han, S.W. (2020). Comparative study on exponentially weighted moving average approaches for the self-starting forecasting, Applied Sciences, 10, 7351.
DOI: doi:10.3390/app10207351
Impact Factor:2.474
#forecasting
International Paper
Machine Learning
Kim, Y., Do, H., Kim, S.B.* (2020). Outer-points shaver: robust graph-based clustering via node cutting, Pattern Recognition, Vol. 97, 107001. (January)
DOI: https://doi.org/10.1016/j.patcog.2019.107001
Impact Factor:7.196
#clustering#graph#optimization
International Paper
Natural Language Processing
Sung, Y.Y., Kim, S.B.* (2020). Topical keyphrase extraction with hierarchical semantic networks, Decision Support Systems, Vol. 128, 113163. (January)